What KPIs and Analytics Does a Semiconductor Manufacturer Use?
Yield Rate: Yield rate measures the percentage of good, usable chips produced compared to the total number of chips manufactured. It's a crucial indicator of production efficiency and quality control.
Defect Density: Defect density quantifies the number of defects or faults per unit area of semiconductor wafer. Lower defect densities indicate higher product quality.
Throughput and Cycle Time: Throughput measures the number of wafers processed per unit of time, while cycle time refers to the time taken to complete a specific manufacturing step. Both KPIs are critical for optimizing production efficiency.
Equipment Utilization and OEE (Overall Equipment Effectiveness): Equipment utilization calculates the percentage of time that manufacturing equipment is actively used. OEE combines availability, performance, and quality to assess the overall efficiency of equipment.
Scrap and Rework Rates: Scrap rate measures the percentage of defective or unusable chips in a production batch. Rework rate quantifies the percentage of chips that need to be reprocessed due to defects.
Process Capability Indices (Cpk): Process capability indices evaluate the capability of a manufacturing process to produce products within specified tolerance limits. Higher Cpk values indicate more precise and controlled processes.
First Pass Yield (FPY): FPY calculates the percentage of units that pass through the entire manufacturing process without requiring rework or being scrapped. It's a critical metric for assessing production efficiency and cost-effectiveness.
Mean Time Between Failures (MTBF) and Mean Time to Repair (MTTR): MTBF measures the average time between equipment failures, while MTTR quantifies the average time taken to repair equipment. These metrics are crucial for maintaining equipment reliability and minimizing downtime.
Inventory Turns: Inventory turns assess how efficiently raw materials and finished goods are utilized in the manufacturing process. Higher turns indicate better inventory management.
Wafer Fab Utilization: This KPI evaluates the percentage of time that the wafer fabrication facility is in use. It helps optimize resource allocation and capacity planning.
Cost per Wafer and Cost per Die: These metrics assess the cost-effectiveness of the manufacturing process by evaluating the expenses associated with producing each wafer and individual die.
Customer Return Rate: This KPI measures the percentage of products returned by customers due to defects or quality issues. It provides valuable feedback on product quality and customer satisfaction.
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